Spectroscopic Ellipsometry

Spectro-ellipsometry on cadmium stearate Langmuir–Blodgett films

Surface Science / Colloids and Surfaces / Thin Films and Coatings / Spectroscopic Ellipsometry / Langmuir Blodgett Multilayers

Spectro-ellipsometry on cadmium stearate Langmuir–Blodgett films

Materials Science / Biomedical Engineering / Atomic Force Microscopy / Refractive Index / Silicon Wafer / Spectroscopic Ellipsometry / Langmuir Blodgett / Film Thickness / Experimental Data / Spectroscopic Ellipsometry / Langmuir Blodgett / Film Thickness / Experimental Data

Spectro-ellipsometry on cadmium stearate Langmuir–Blodgett films

Materials Science / Biomedical Engineering / Atomic Force Microscopy / Refractive Index / Silicon Wafer / Spectroscopic Ellipsometry / Langmuir Blodgett / Film Thickness / Experimental Data / Spectroscopic Ellipsometry / Langmuir Blodgett / Film Thickness / Experimental Data

Characterization of nanostructured GaSb: comparison between large-area optical and local direct microscopic techniques

Mechanical Engineering / Scanning Electron Microscopy / Atomic Force Microscopy / High Resolution Transmission Electron Microscopy / Applied / Optical Properties / Applied Optics / Optical physics / Self Organization / Surface Area / Spectroscopic Ellipsometry / Mueller Matrix Polarimetry / Ion Beam / Electrical And Electronic Engineering / Volume Fraction / Optical Properties / Applied Optics / Optical physics / Self Organization / Surface Area / Spectroscopic Ellipsometry / Mueller Matrix Polarimetry / Ion Beam / Electrical And Electronic Engineering / Volume Fraction

Accurate electrical activation characterization of CMOS ultra-shallow profiles

Engineering / Materials Science / Secondary Ion Mass Spectrometry / Physical sciences / CHEMICAL SCIENCES / Spectroscopic Ellipsometry / Low Temperature / Infra red / Spectroscopic Ellipsometry / Low Temperature / Infra red

Accurate electrical activation characterization of CMOS ultra-shallow profiles

Engineering / Materials Science / Secondary Ion Mass Spectrometry / Physical sciences / CHEMICAL SCIENCES / Spectroscopic Ellipsometry / Low Temperature / Infra red / Spectroscopic Ellipsometry / Low Temperature / Infra red

Spectro-ellipsometry on cadmium stearate Langmuir–Blodgett films

Materials Science / Biomedical Engineering / Atomic Force Microscopy / Refractive Index / Silicon Wafer / Spectroscopic Ellipsometry / Langmuir Blodgett / Film Thickness / Experimental Data / Spectroscopic Ellipsometry / Langmuir Blodgett / Film Thickness / Experimental Data

Optical Properties of 3,4,9,10-perylenetetracarboxylic dianhydride/copper phthalocyanine superlattices

Engineering / Organic Semiconductors / Applied Physics / Mathematical Sciences / Copper / Physical sciences / Optical Properties / Fourier transform / Room Temperature / Infrared spectra / Spectroscopic Ellipsometry / Organic Compound / Superlattices / Physical sciences / Optical Properties / Fourier transform / Room Temperature / Infrared spectra / Spectroscopic Ellipsometry / Organic Compound / Superlattices

Accurate electrical activation characterization of CMOS ultra-shallow profiles

Engineering / Materials Science / Secondary Ion Mass Spectrometry / Physical sciences / CHEMICAL SCIENCES / Spectroscopic Ellipsometry / Low Temperature / Infra red / Spectroscopic Ellipsometry / Low Temperature / Infra red

Accurate electrical activation characterization of CMOS ultra-shallow profiles

Engineering / Materials Science / Secondary Ion Mass Spectrometry / Physical sciences / CHEMICAL SCIENCES / Spectroscopic Ellipsometry / Low Temperature / Infra red / Spectroscopic Ellipsometry / Low Temperature / Infra red

Genesis Silicon Carbide Concentrator Target 60003 Preliminary Ellipsometry Mapping Results

Silicon Carbide / Solar Wind / Spectroscopic Ellipsometry

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